{"version":"1.0","provider_name":"Inskill VLSIGURU Elearning Platform","provider_url":"https:\/\/inskill.in\/training","title":"Common Challenges in DFT Implementation and Verification - Inskill VLSIGURU Elearning Platform","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"SlBGiAtpZx\"><a href=\"https:\/\/inskill.in\/training\/vlsi\/common-challenges-in-dft-implementation-and-verification\/\">Common Challenges in DFT Implementation and Verification<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/inskill.in\/training\/vlsi\/common-challenges-in-dft-implementation-and-verification\/embed\/#?secret=SlBGiAtpZx\" width=\"600\" height=\"338\" title=\"&#8220;Common Challenges in DFT Implementation and Verification&#8221; &#8212; Inskill VLSIGURU Elearning Platform\" data-secret=\"SlBGiAtpZx\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/inskill.in\/training\/wp-includes\/js\/wp-embed.min.js\n\/* ]]> *\/\n<\/script>\n","description":"In the world of semiconductor design, Design for Testability (DFT) plays a crucial role in ensuring that chips are thoroughly tested for manufacturing defects before reaching production. As integrated circuits (ICs) become more complex, the demand for effective DFT strategies has skyrocketed. However, engineers often face several obstacles in implementing and verifying these techniques. Understanding [&hellip;]"}