An HBM3 training course typically covers the fundamentals of DRAM, HBM architecture, and HBM3-specific features, including signal descriptions, channel architecture, and error handling, aiming to equip engineers with the knowledge for designing and validating systems using HBM3 technology.
| sl.no | Topic | Duration |
| 1 | DDR significance in SOC, memory categories, SRAM versus DRAM, DRAM cell array | 01:25:37 |
| 2 | DDR memory organization | 01:12:53 |
| 3 | Rank, Channel, SIMM, DIMM, DDR evolution | 25:47 |
| 4 | DDR evolution | 23:16 |
| 5 | DDR frequently used terms | 15:04 |
| 6 | DDR wrapper architecture | 15:40 |
| 7 | DDR wrapper signals | 35:17 |
| 8 | Interleaved and sequential access | 13:47 |
| 9 | Need for HBM | 25:45 |
| 10 | HBM features | 12:07 |
| 11 | HBM evolution | 14:36 |
| 12 | HBM Memory Organization | 15:27 |
| 13 | Pseudo channels | 07:50 |
| 14 | IO Signal description | 12:27 |
| 15 | Microbump positions | 14:04 |
| 16 | How HBM differs from DDR | 06:31 |
| 17 | HBM channel addressing, Bank groups | 16:57 |
| 18 | Channel Addressing example | 23:50 |
| 19 | HBM4 channel addressing updates | 10:10 |
| 20 | HBM4 bank group updates | 02:39 |
| 21 | HBM4 IO signal description updates | 04:42 |
| 22 | HBM4 DRAM organization updates | 05:12 |
| 23 | HBM State diagram | 05:18 |
| 24 | HBM Initialization | 07:41 |
| 25 | Power on and controlled power off sequence | 02:49 |
| 26 | HBM mode register summary | 07:51 |
| 27 | Mode register fields | 13:20 |
| 28 | HBM4 mode register updates | 10:59 |
| 29 | Clocking overview | 14:07 |
| 30 | WDQS to CK Alignment | 11:38 |
| 31 | Data bus inversion | 17:31 |
| 32 | Commands truth table | 11:47 |
| 33 | commands RNOP Activate | 13:34 |
| 34 | Precharge | 20:07 |
| 35 | Refresh | 24:05 |
| 36 | DRFM - Directed refresh management | 18:25 |
| 37 | Refresh management | 15:32 |
| 38 | Column commands : READ | 22:44 |
| 39 | Column commands : WRITE | 14:36 |
| 40 | Column commands : MRS | 04:38 |
| 41 | Commands: PDE, PDX | 10:21 |
| 42 | Commands: SRE, SRX | 08:13 |
| 43 | HBM-Parity | 17:08 |
| 44 | Clock frequency change sequence | 00:56 |
| 45 | Interconnect redundancy remapping : DWORD remapping | 05:42 |
| 45 | Temperature Compensated refresh reporting | 03:27 |
| 46 | Interconnect redundancy remapping: AWORD remapping | 13:37 |
| 48 | Interconnect redundancy remapping: WSO remapping | 09:10 |
| 49 | Direct access test port | 05:15 |
| 50 | IEEE Standard 1500 | 34:08 |
| 51 | Wrapper data register types | 08:19 |
| 52 | WIR test instruction encodings | 11:53 |
| 53 | IEEE150 Bypass Extest rx tx | 12:33 |
| 54 | IEEE1500 ses5 HBM Reset | 05:43 |
| 55 | IEEE1500 MBIST | 03:07 |
| 56 | IEEE1500 soft repair | 11:05 |
| 57 | IEEE1500 hard repair | 03:02 |
| 58 | IEEE1500 DWORD MISR | 06:20 |
| 59 | IEEE1500 AWORD MISR | 05:39 |
| 60 | IEEE1500DEVICE ID, CHANNEL ID | 09:50 |
| 61 | IEEE1500 TEMPARATURE READ, LFSR COMPARE STICKY | 07:42 |
| 62 | IEEE1500 soft lane,hard lane repair | 08:58 |
| 63 | IEEE1500 channel disable and channel temparature | 06:54 |
| 64 | IEEE1500 WOSC RUN and WOSC COUNT | 03:12 |
| 65 | IEEE1500 ECS Error log | 05:08 |
| 66 | IEEE1500 HS REP CAP | 05:27 |
| 67 | IEEE1500 SELF REP and SELF REP RESULTS | 05:29 |
| 68 | IEEE1500 interaction with mission mode operation | 02:04 |
| 69 | OnDie DRAM ECC | 09:45 |
| 70 | DRAM fault isolation | 03:41 |
| 71 | ECC engine test mode | 07:00 |
| 72 | ECC transparency protocol | 09:46 |
| 73 | ECC Engine testmode | 12:08 |
| 74 | WDQS Interval Oscillator | 13:44 |
| 75 | DCA, DCM | 12:07 |
| 76 | Loopback test modes | 13:47 |
| 77 | Loopback modes features - Entering and exiting AWORD and DWORD MISR mode | 08:00 |
| 78 | AWORD and DWORD MISR mode - General features | 03:58 |
| 79 | AWORD and DWORD write parity checking, preset state for MISR registers | 08:28 |
| 80 | Loopback test modes: Summary | 12:01 |
| 81 | AWORD and DWORD Write MISR Modes | 07:20 |
| 82 | AWORD and DWORD Write register Modes | 10:20 |
| 83 | Test method for DWORD LFSR mode (Read direction) | 18:06 |
| 84 | Self repair | 16:01 |
| 85 | Self repair flow chart | 04:10 |
| Channel Definition |
| Channel Addressing |
| Simplified State Diagram |
| HBM3 Power-up and Initialization Sequence |
| Controlled Power-off Sequence |
| Initialization Sequence with Stable Power |
| Initialization Sequence for Use of IEEE 1500 Instruction Including Lane Repairs and Channel Disable |
| MR0 to MR15 |
| Master boot record sector |
| Partition table |
| Partition table entry |
| HBM3 Clocking Overview |
| WDQS-to-CK Alignment Training |
| HBM3 Data Bus Inversion (DBIac) |
| Data Bus Inversion (DBIac) |
| Internal DBIac State with Read Commands |
| Command Truth Tables |
| Row Commands |
| Row No Operation (RNOP) Command |
| ACTIVATE (ACT) Command |
| PRECHARGE (PREpb) and PRECHARGE ALL (PREab) Commands |
| Rounding Rules for Row Access Timings |
| REFRESH Command (REFab) |
| PER-BANK REFRESH Command (REFpb) |
| Refresh Management (RFM) |
| Adaptive Refresh Management (ARFM) |
| Column Commands |
| Column No Operation (CNOP) |
| Read Command (RD, RDA) |
| Write Command (WR, WRA) |
| Mode Register Set (MRS) Command |
| Power-Mode Commands |
| Power-Down (PDE, PDX) |
| Self Refresh (SRE, SRX) |
| Parity |
| Command/Address Parity |
| Data Parity |
| Clock Frequency Change Sequence |
| Temperature Compensated Refresh Reporting |
| Temperature Compensated Refresh Trip Points |
| Catastrophic Temperature Sensor |
| Interconnect Redundancy Remapping |
| AWORD Remapping |
| Row Command Bus – Remapping Table |
| Column Command Bus – Remapping Table |
| AWORD Remapping Examples |
| DWORD Remapping |
| DWORD Remapping Table |
| DWORD Remapping Example |
| HBM3 Loopback Test Modes |
| HBM3 Polynomial Structure |
| AWORD MISR Polynomial |
| DWORD MISR Polynomial |
| General Loopback Modes Features and Behavior |
| AWORD and DWORD Write MISR Modes |
| Test Method for AWORD (Write) MISR Mode |
| Test Method for DWORD Write MISR Mode |
| AWORD and DWORD Write Register Modes |
| Test Method for AWORD (Write) Register Mode |
| Test Method for DWORD Write Register Mode |
| DWORD Read Register Mode |
| Test Method for DWORD Read Register Mode |
| DWORD LFSR Mode (Read direction) |
| Test Method for DWORD LFSR Mode (Read direction) |
| AWORD and DWORD Write LFSR Compare Modes |
| Test method for AWORD (Write) LFSR Compare Mode |
| Test Method for DWORD Write LFSR Compare mode |
| On-die DRAM ECC |
| ECC Overview |
| HBM3 On-die ECC Requirements |
| DRAM Fault Isolation Requirements |
| Error Check and Scrub (ECS) |
| On-die ECC Transparency Protocol |
| ECC Engine Test Mode |
| WOSC |
| WDQS Interval Oscillator |
| tWDQS2DQ_I Offset due to Temperature and Voltage Variation |
| DCA and DCM |
| Duty Cycle Adjuster (DCA) |
| Duty Cycle Monitor (DCM) |
| Self Repair |
| Absolute Maximum DC Rating |
| Recommended DC Operating Condition |
| Operating Temperature |
| Leakage Current |
| Capacitance |
| DQ Rx Voltage and Timing |
| AWORD Signaling |
| CK and WDQS Input Signaling |
| Midstack Signaling |
| Transmit Driver Currents |
| Output Timing Reference Load |
| Output Voltage Level |
| Output Rise and Fall Time |
| Overshoot/Undershoot |
| IDD and IPP Specification Parameters and Test Conditions |
| IDD and IPP Specifications |
| IDD6 Specification |
| Signals |
| MicroBump Positions |
| HBM3 Stack Height |
| HBM3 Bump Map |
| Direct Access (DA) Test Port |
| DA Test Port Lockout |
| IEEE Standard 1500 |
| Interaction Between DA Test Port and IEEE1500 Test Access Port |
| IEEE1500 Test Access Port I/O Signals |
| IEEE1500 Test Access Port Functional Description |
| Wrapper Data Register (WDR) Types |
| Read Only (R) Wrapper Data Registers |
| Write Only (W) Wrapper Data Registers |
| Read and Write (R/W) Wrapper Data Registers |
| WDR Reset State |
| IEEE1500 Test Access Port Instruction Encodings |
| Test Instructions |
| BYPASS |
| EXTEST_RX and EXTEST_TX |
| HBM_RESET |
| MBIST |
| SOFT_REPAIR |
| HARD_REPAIR |
| DWORD_MISR |
| AWORD_MISR |
| CHANNEL_ID |
| AWORD_MISR_CONFIG |
| DEVICE_ID |
| TEMPERATURE |
| MODE_REGISTER_DUMP_SET |
| READ_LFSR_COMPARE_STICKY |
| SOFT_LANE_REPAIR and HARD_LANE_REPAIR |
| CHANNEL_DISABLE |
| CHANNEL TEMPERATURE |
| WOSC_RUN and WOSC_COUNT |
| ECS Error Log |
| HS_REP_CAP |
| SELF_REP and SELF_REP_RESULTS |
| Interaction with Mission Mode Operation |
| IEEE1500 Test Port AC Timing Parameters |
| Boundary Scan |
TESTIMONIALS
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Course does not have any pre-requisites. However any exposure to Digital design, VLSI design flow is an added advantage.